Invited Presentation by G. Volpe at SPIE-Ultrafast Nonlinear Imaging and Spectroscopy XIV, 24 August 2026

DeepTrack 2 Logo. (Image from DeepTrack 2 Project)
Artificial Intelligence for Microscopy: From Pixels to Physical Insight
Giovanni Volpe
(Invited Paper)
Date: 24 August 2026
Time: 9:45 AM – 10:10 AM PDT
Place: Conv. Ctr. Room 15B

Advances in artificial intelligence are transforming microscopy from a tool of observation into a tool of discovery. Modern machine learning algorithms—especially deep neural networks—enable us to reconstruct, segment, and interpret microscopic images with unprecedented speed and precision. In this talk, I will discuss how AI can enhance every step of the microscopy pipeline, from data acquisition and noise reduction to virtual staining and quantitative analysis. Drawing on examples from my group’s work—including the DeepTrack framework for physics-aware deep learning and AI-driven virtual microscopy—I will show how we can train models to reveal hidden structures, track dynamic processes, and even uncover underlying physical laws directly from images. Beyond technical performance, I will also address the broader implications of this transformation: how AI reshapes the role of the experimenter, the reproducibility of quantitative microscopy, and the future of scientific understanding in an era of data-driven discovery.

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