Invited Presentation by G. Volpe at FiO LS, 4 November 2021

DeepTrack 2.0 Logo. (Image from DeepTrack 2.0 Project)
DeepTrack 2.0: A Framework for Deep Learning for Microscopy
Giovanni Volpe
Invited Presentation at Frontiers in Optics + Laser Science
Online
4 November 2021
4:00 PM

We present DeepTrack 2.0, a software to design, train, and validate deep-learning solutions for digital microscopy. We demonstrate it for applications from particle localization, tracking, and characterization, to cell counting and classification, to virtual staining.

Link: FTh6A.3

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