Giovanni Volpe
Electromagnetic and Light Scattering (ELS) XXI
Date: 27 June 2025
Time: 9:00
Place: Milazzo, Italy
Electromagnetic light scattering underpins a wide range of phenomena in both fundamental and applied research, from characterizing complex materials to tracking particles and cells in microfluidic devices. Video microscopy, in particular, has become a powerful method for studying scattering processes and extracting quantitative information. Yet, conventional algorithmic approaches for analyzing scattering data often prove cumbersome, computationally expensive, and highly specialized.
Recent advances in deep learning offer a compelling alternative. By leveraging data-driven models, we can automate the extraction of scattering characteristics with unprecedented speed and accuracy—uncovering insights that classical techniques might miss or require substantial computation to achieve. Despite these advantages, deep-learning-based tools remain underutilized in light-scattering research, largely because of the steep learning curve required to design and train such models.
To address these challenges, we have developed a user-friendly software platform (DeepTrack, now in version 2.2) that simplifies the entire workflow of deep-learning applications in digital microscopy. DeepTrack enables straightforward creation of custom datasets, network architectures, and training pipelines specifically tailored for quantitative scattering analyses. In this talk, I will discuss how emerging deep-learning methods can be combined with advanced imaging technologies to push the boundaries of electromagnetic light scattering research—reducing computational overhead, improving accuracy, and ultimately broadening access to powerful, data-driven solutions.