Invited Presentation by B. Yeroshenko at SPIE-ETAI, San Diego, 5 August 2025

Kymographs of DNA inside Channel II. (Image from 10.1038/s41592-022-01491-6. by Barbora Špačková)
Pushing the limits of label-free single-molecule characterization by nanofluidic scattering microscopy
Bohdan Yeroshenko, Henrik Klein Moberg, Leyla Beckerman, Joachim Fritzsche, David Albinsson, Barbora Špačková, Daniel Midtvedt, Giovanni Volpe, Christoph Langhammer
SPIE-ETAI, San Diego, CA, USA, 3 – 7 August 2025
Date: 5 August 2025
Time: 8:45 AM – 9:15 AM PDT
Place: Conv. Ctr. Room 4

Nanofluidic Scattering Microscopy (NSM) is a label-free characterization method that leverages the interference of light scattered by nanochannels and single molecules within them. This technique enables accurate determination of molecular weight and hydrodynamic radius based solely on scattering, without requiring prior molecular knowledge. However, standard analysis methods limit NSM’s sensitivity to 66 kDa for proteins. In this presentation, I will demonstrate how we push this detection limit an order of magnitude further by integrating ultrasmall geometry with an advanced machine learning analysis approach, all while maintaining the same input laser power intensity.

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