Deep learning for microscopy, optical tweezers, and active matter
3 March 2022, 13:15
Plenary talk for Physics Days 2022 – Future Leaders
After a brief overview of artificial intelligence, machine learning and deep learning, I will present a series of recent works in which we have employed deep learning for applications in microscopy, optical tweezers, and active matter. In particular, I will explain how we employed deep learning to enhance digital video microscopy [1,2], to perform virtual staining of , to estimate the properties of anomalous diffusion [4,5,6], to characterize microscopic force fields , to improve the calculation of optical forces , and to characterize nanoparticles . Finally, I will provide an outlook on the future for the application of deep learning in these fields.
 S. Helgadottir, A. Argun, and G. Volpe. Digital video microscopy enhanced by deep learning. Optica 6, 506 (2019).
 B. Midtvedt, S. Helgadottir, A. Argun, J. Pineda, D. Midtvedt, and G. Volpe. Quantitative digital microscopy with deep learning. Appl. Phys. Rev. 8, 011310 (2021).
 S. Helgadottir, B. Midtvedt, J. Pineda, et al. Extracting quantitative biological information from bright-field cell images using deep learning. Biophys. Rev. 2, 031401 (2021).
 S. Bo, F. Schmidt, R. Eichhorn, and G. Volpe. Measurement of anomalous diffusion using recurrent neural networks. Phys. Rev. E 100, 010102 (2019).
 A. Argun, G. Volpe, and S. Bo. Classification, inference and segmentation of anomalous diffusion with recurrent neural networks. J. Phys. A: Math. Theor. 54, 294003 (2021).
 G. Muñoz-Gil, G. Volpe, M. A. Garcia-March, et al. Objective comparison of methods to decode anomalous diffusion. Nat. Commun. 12, 6253 (2021).
 A. Argun, T. Thalheim, S. Bo, F. Cichos, and G. Volpe. Enhanced force-field calibration via machine learning. Appl. Phys. Rev. 7, 041404 (2020).
 I.C.D. Lenton, G. Volpe, A.B. Stilgoe, T.A. Nieminen, and H. Rubinsztein-Dunlop. Machine learning reveals complex behaviours in optically trapped particles. Mach. Learn.: Sci. Technol. 1, 045009 (2020).
 B. Midtvedt, E. Olsén, F. Eklund, F. Höök, C.B. Adiels, G. Volpe, and D. Midtvedt. Fast and accurate nanoparticle characterization using deep-learning-enhanced off-axis holography. ACS Nano 15, 2240 (2021).
Link: Physics Days 2022 – Future Leaders
The Physics Days 2022 is organized by the Finnish Physical Society and the Department of Applied Physics at Aalto University.